ATOMIC FORCE MICROSCOPY PRINCIPLES, DEVELOPMENTS AND APPLICATIONS
Atomic Force Microscopy: Principles, Developments and Applications presents Atomic Force Microscopy (AFM) as one of the most powerful tools for the analysis of morphologies because it creates three-dimensional images at the angstrom and nano scale. This technique has been exhaustively used in the an...
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| Other Authors: | , |
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| Format: | Book |
| Language: | English |
| Published: |
New York
Nova Science Publishers
2018
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| Series: | Laboratory and clinical research
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| Subjects: | |
| Online Access: | Click Here to View Status and Holdings. |
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Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching application to rough and natural surfaces
