ATOMIC FORCE MICROSCOPY PRINCIPLES, DEVELOPMENTS AND APPLICATIONS

ATOMIC FORCE MICROSCOPY PRINCIPLES, DEVELOPMENTS AND APPLICATIONS

Atomic Force Microscopy: Principles, Developments and Applications presents Atomic Force Microscopy (AFM) as one of the most powerful tools for the analysis of morphologies because it creates three-dimensional images at the angstrom and nano scale. This technique has been exhaustively used in the an...

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Bibliographic Details
Other Authors: Moss, Bessie (Editor), Stone, Clayton (Editor)
Format: Book
Language:English
Published: New York Nova Science Publishers 2018
Series:Laboratory and clinical research
Subjects:
Atomic force microscopy
Microscopy, Atomic Force
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