Hierarchical modeling for VLSI circuit testing

Hierarchical modeling for VLSI circuit testing

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Bibliographic Details
Main Author: Bhattacharya, Debashis 1961-
Other Authors: Hayes, John P. (John Patrickd1944-
Format: Unknown
Language:English
Published: Boston Kluwer Academic Publishers 1990
Series:The Kluwer international series in engineering and computer science.
Subjects:
Integrated circuits > Very large scale integration > Testing
Integrated circuits > Very large scale integration > Computer simulation
Online Access:Click Here to View Status and Holdings.
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Description
Physical Description:x, 159 p. ill. 24 cm
Bibliography:Includes bibliographical references (p. [149]-155).
ISBN:079239058X

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