Hierarchical modeling for VLSI circuit testing

Saved in:

Bibliographic Details
Main Author:	Bhattacharya, Debashis 1961-
Other Authors:	Hayes, John P. (John Patrickd1944-
Format:	Unknown
Language:	English
Published:	Boston Kluwer Academic Publishers 1990
Series:	The Kluwer international series in engineering and computer science.
Subjects:	Integrated circuits > Very large scale integration > Testing Integrated circuits > Very large scale integration > Computer simulation
Online Access:	Click Here to View Status and Holdings.
Tags:	Add Tag No Tags, Be the first to tag this record!

Internet