Designing, testing, and diagnostics--join them International Test Conference 1993 proceedings, October 17-21, 1993, Convention Center, Baltimore, Maryland, USA

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Bibliographic Details
Corporate Authors:	International Test Conference, Institute of Electrical and Electronics Engineers, IEEE Computer Society
Format:	Book
Published:	Altoona, PA. International Test Conference 1993
Subjects:	Integrated circuits > Testing > Congresses Automatic checkout equipment > Congresses
Online Access:	Click Here to View Status and Holdings.
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001	wils-88606
020	#	#	\|a 0780314301
090	0	0	\|a TK7874 \|b .I474 1993
110	1	#	\|a International Test Conference \|j Baltimore, Md \|k 1993
245	1	1	\|a Designing, testing, and diagnostics--join them \|b International Test Conference 1993 proceedings, October 17-21, 1993, Convention Center, Baltimore, Maryland, USA \|c sponsored by IEEE Computer Society Test Technology Technical Committee and ...
260	#	#	\|a Altoona, PA. \|b International Test Conference \|c 1993
300	#	#	\|a xii, 1065 p. \|b ill. \|c 29 cm
504	#	#	\|a Includes bibliographical references and index
650	#	0	\|a Integrated circuits \|x Testing \|x Congresses
650	#	0	\|a Automatic checkout equipment \|x Congresses
710	1	#	\|a Institute of Electrical and Electronics Engineers \|c Philadelphia Section
710	#	#	\|a IEEE Computer Society \|c Test Technology Technical Committee
856	4	0	\|z Click Here to View Status and Holdings. \|u https://opac.uitm.edu.my/opac/detailsPage/detailsHome.jsp?tid=88606
964	#	#	\|c BOK \|d 01
040	#	#	\|a Shah Alam
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