Designing, testing, and diagnostics--join them International Test Conference 1993 proceedings, October 17-21, 1993, Convention Center, Baltimore, Maryland, USA

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Bibliographic Details
Corporate Authors:	International Test Conference, Institute of Electrical and Electronics Engineers, IEEE Computer Society
Format:	Book
Published:	Altoona, PA. International Test Conference 1993
Subjects:	Integrated circuits > Testing > Congresses Automatic checkout equipment > Congresses
Online Access:	Click Here to View Status and Holdings.
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