Designing, testing, and diagnostics--join them International Test Conference 1993 proceedings, October 17-21, 1993, Convention Center, Baltimore, Maryland, USA

Designing, testing, and diagnostics--join them International Test Conference 1993 proceedings, October 17-21, 1993, Convention Center, Baltimore, Maryland, USA

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Bibliographic Details
Corporate Authors: International Test Conference, Institute of Electrical and Electronics Engineers, IEEE Computer Society
Format: Book
Published: Altoona, PA. International Test Conference 1993
Subjects:
Integrated circuits > Testing > Congresses
Automatic checkout equipment > Congresses
Online Access:Click Here to View Status and Holdings.
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Description
Physical Description:xii, 1065 p. ill. 29 cm
Bibliography:Includes bibliographical references and index
ISBN:0780314301

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