Bridging faults and IDDQ testing

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Bibliographic Details
Corporate Author:	IEEE Computer Society
Other Authors:	Malaiya, Yashwant K, Rajsuman, Rochit
Format:	Book
Published:	Los Alamitos, Calif. IEEE Computer Society Press l992
Series:	IEEE Computer Society Press technology series
Subjects:	Metal oxide semiconductors, Complementary > Testing > Data processing Iddq testing
Online Access:	Click Here to View Status and Holdings.
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LEADER	00000n a2200000 a 4501
001	wils-86598
020	#	#	\|a 0818632151
090	0	0	\|a TK7871.99.M44 \|b B75 1992
245	1	1	\|a Bridging faults and IDDQ testing \|c [edited] by Yashwant K. Malaiya and Rochit Rajsuman
260	#	#	\|a Los Alamitos, Calif. \|b IEEE Computer Society Press \|c l992
300	#	#	\|a vi, 128 p. \|b ill. \|c 28 cm
490	1	#	\|a IEEE Computer Society Press technology series
500	#	#	\|a "Sponsored by the IEEE Computer Society Technical Commitee on Test Technology"
504	#	#	\|a Includes bibliographical references
650	#	0	\|a Metal oxide semiconductors, Complementary \|x Testing \|x Data processing
650	#	0	\|a Iddq testing
700	1	#	\|a Malaiya, Yashwant K
700	#	#	\|a Rajsuman, Rochit
710	1	#	\|a IEEE Computer Society. \|c Test Technology Technical Committee
856	4	0	\|z Click Here to View Status and Holdings. \|u https://opac.uitm.edu.my/opac/detailsPage/detailsHome.jsp?tid=86598
964	#	#	\|c BOK \|d 01
040	#	#	\|a Shah Alam