Bridging faults and IDDQ testing

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Bibliographic Details
Corporate Author:	IEEE Computer Society
Other Authors:	Malaiya, Yashwant K, Rajsuman, Rochit
Format:	Unknown
Published:	Los Alamitos, Calif. IEEE Computer Society Press l992
Series:	IEEE Computer Society Press technology series
Subjects:	Metal oxide semiconductors, Complementary > Testing > Data processing Iddq testing
Online Access:	Click Here to View Status and Holdings.
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