Bridging faults and IDDQ testing

Bridging faults and IDDQ testing

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Bibliographic Details
Corporate Author: IEEE Computer Society
Other Authors: Malaiya, Yashwant K, Rajsuman, Rochit
Format: Book
Published: Los Alamitos, Calif. IEEE Computer Society Press l992
Series:IEEE Computer Society Press technology series
Subjects:
Metal oxide semiconductors, Complementary > Testing > Data processing
Iddq testing
Online Access:Click Here to View Status and Holdings.
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Description
Item Description:"Sponsored by the IEEE Computer Society Technical Commitee on Test Technology"
Physical Description:vi, 128 p. ill. 28 cm
Bibliography:Includes bibliographical references
ISBN:0818632151

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