Neural models and algorithms for digital testing
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| Other Authors: | , |
| Format: | Book |
| Published: |
Boston
Kluwer Academic Publishers
1991
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| Series: | The Kluwer international series in engineering and computer science VLSI, computer architecture, and digital signal processing
SECS 140. |
| Subjects: | |
| Online Access: | Click Here to View Status and Holdings. |
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Designing, testing, and diagnostics--join them International Test Conference 1993 proceedings, October 17-21, 1993, Convention Center, Baltimore, Maryland, USA
Digital integrated electronics
