Neural models and algorithms for digital testing

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Bibliographic Details
Main Author:	Chakradhar, Srimat T
Other Authors:	Agrawal, Vishwani D. 1943-, Bushnell, Michael Lee 1950-
Format:	Unknown
Published:	Boston Kluwer Academic Publishers 1991
Series:	The Kluwer international series in engineering and computer science VLSI, computer architecture, and digital signal processing SECS 140.
Subjects:	Digital integrated circuits > Testing Logic circuits > Testing Automatic checkout equipment
Online Access:	Click Here to View Status and Holdings.
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