NMOS C-V characterization of gate dielectric thickness
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Main Author: | |
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Corporate Authors: | , , , |
Other Authors: | , , |
Format: | Thesis |
Published: |
Shah Alam, Selangor
Universiti Teknologi MARA
2011
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Subjects: | |
Online Access: | Click Here to View Status and Holdings. |
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Physical Description: | ix, 72 p. ill. 30 cm 1 CD-ROM (4 3/4 in.) |
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