Modeling nanoscale imaging in electron microscopy

Saved in:
Bibliographic Details
Other Authors: Vogt, Thomas, Dahmen, Wolfgang 1949-, Binev, Peter
Format: Book
Language:English
Published: New York Springer 2012
Series:Nanostructure science and technology
Subjects:
Online Access:Click Here to View Status and Holdings.
Tags: Add Tag
No Tags, Be the first to tag this record!

Similar Items