Modeling nanoscale imaging in electron microscopy

Saved in:

Bibliographic Details
Other Authors:	Vogt, Thomas, Dahmen, Wolfgang 1949-, Binev, Peter
Format:	eBook
Language:	English
Published:	New York Springer 2012
Series:	Nanostructure science and technology
Subjects:	Scanning transmission electron microscopy > Simulation methods Image analysis
Online Access:	Click Here to View Status and Holdings.
Tags:	Add Tag No Tags, Be the first to tag this record!

Internet