Modeling nanoscale imaging in electron microscopy

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Bibliographic Details
Other Authors:	Vogt, Thomas, Dahmen, Wolfgang 1949-, Binev, Peter
Format:	Book
Language:	English
Published:	New York Springer 2012
Series:	Nanostructure science and technology
Subjects:	Scanning transmission electron microscopy > Simulation methods Image analysis
Online Access:	Click Here to View Status and Holdings.
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