Modeling nanoscale imaging in electron microscopy

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Bibliographic Details
Other Authors:	Vogt, Thomas, Dahmen, Wolfgang 1949-, Binev, Peter
Format:	eBook
Language:	English
Published:	New York Springer 2012
Series:	Nanostructure science and technology
Subjects:	Scanning transmission electron microscopy > Simulation methods Image analysis
Online Access:	Click Here to View Status and Holdings.
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MARC


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020	#	#	\|a 9781461421900 (hbk.)
020	#	#	\|a 146142190X (hbk.)
040	#	#	\|a GW5XE \|d ITMB
090	0	0	\|a QH212.S34 \|b M63 2012
245	0	0	\|a Modeling nanoscale imaging in electron microscopy \|c edited by Thomas Vogt, Wolfgang Dahmen, Peter Binev
260	#	#	\|a New York \|b Springer \|c 2012
300	#	#	\|a ix, 182 p. \|b ill. (some col.) \|c 24 cm
490	1	#	\|a Nanostructure science and technology \|x 1571-5744
504	#	#	\|a Includes bibliographical references and index
650	#	#	\|a Scanning transmission electron microscopy \|x Simulation methods
650	#	#	\|a Image analysis
700	1	#	\|a Vogt, Thomas
700	1	#	\|a Dahmen, Wolfgang \|c 1949-
700	1	#	\|a Binev, Peter
830	0	#	\|a Nanostructure science and technology
856	4	0	\|z Click Here to View Status and Holdings. \|u https://opac.uitm.edu.my/opac/detailsPage/detailsHome.jsp?tid=473732
964	#	#	\|c BOK \|d EM
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