Modeling nanoscale imaging in electron microscopy

Modeling nanoscale imaging in electron microscopy

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Bibliographic Details
Other Authors: Vogt, Thomas, Dahmen, Wolfgang 1949-, Binev, Peter
Format: Book
Language:English
Published: New York Springer 2012
Series:Nanostructure science and technology
Subjects:
Scanning transmission electron microscopy > Simulation methods
Image analysis
Online Access:Click Here to View Status and Holdings.
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Description
Physical Description:ix, 182 p. ill. (some col.) 24 cm
Bibliography:Includes bibliographical references and index
ISBN:9781461421900 (hbk.)
146142190X (hbk.)
ISSN:1571-5744

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