Fundamentals of Modern VLSI Devices

Learn the basic properties and designs of modern VLSI devices, as well as the factors affecting performance, with this thoroughly updated second edition. The first edition has been widely adopted as a standard textbook in microelectronics in many major US universities and worldwide. The internationa...

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Bibliographic Details
Main Authors: Taur, Yuan 1946- (Author), Ning, Tak H. 1943- (Author)
Format: Book
Language:English
Published: Cambridge, UK Cambridge University Press 2009
Edition:SECOND EDITION
Subjects:
Online Access:Click Here to View Status and Holdings.
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