Reliability of MEMS
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Other Authors: | , |
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Format: | Book |
Published: |
Weinheim
Wiley-V
2008
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Series: | Advanced micro & nanosystems
v6 |
Subjects: | |
Online Access: | Click Here to View Status and Holdings. |
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LEADER | 00000n a2200000 a 4501 | ||
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001 | wils-385833 | ||
020 | # | # | |a 9783527314942 |
020 | # | # | |a 3527314946 |
040 | # | # | |a SISPL |d ITMB |
090 | 0 | 0 | |a TK7875 |b .R437 2008 |
245 | 0 | 0 | |a Reliability of MEMS |c edited by Osamu Tabata and Toshiyuki Tsuchiya |
260 | # | # | |a Weinheim |b Wiley-V |c 2008 |
300 | # | # | |a xx, 303 p |b ill. |c 25 cm |
490 | 1 | # | |a Advanced micro & nanosystems |v v6 |
500 | # | # | |a "Testing of materials and devices"--Cover |
504 | # | # | |a Includes bibliographical references and index |
650 | # | 0 | |a Microelectromechanical systems |x Reliability |
700 | 1 | # | |a Tsuchiya, Toshiyuki. |
700 | # | # | |a Tabata, Osamu |d 1956- |
856 | 4 | 0 | |z Click Here to View Status and Holdings. |u https://opac.uitm.edu.my/opac/detailsPage/detailsHome.jsp?tid=385833 |
964 | # | # | |c BOK |d 01 |
998 | # | # | |a 00260##a0017.8||00260##b0017.8||00260##c0017.8||00300##a0017.8||00300##b0017.8||00300##c0017.8||00500##a0017.8||01700##a0017.8||01700##d0017.8|| |