Defect-oriented testing for nano-metric CMOS VLSI circuit

Defect-oriented testing for nano-metric CMOS VLSI circuit

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Bibliographic Details
Main Author: Sachdev, Manoj
Other Authors: Pineda de Gyvez, Jose
Format: Unknown
Published: Dordrecht Springer 2007
Edition:2nd ed.
Series:Frontiers in electronic testing 34
Subjects:
Metal oxide semiconductors, Complementary > Testing
Metal oxide semiconductors, Complementary > Defects > Defects
Integrated circuits > Very large scale integration > Testing
Integrated circuits > Very large scale integration > Defects
Online Access:Click Here to View Status and Holdings.
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