Defect-oriented testing for nano-metric CMOS VLSI circuit

Saved in:

Bibliographic Details
Main Author:	Sachdev, Manoj
Other Authors:	Pineda de Gyvez, Jose
Format:	Unknown
Published:	Dordrecht Springer 2007
Edition:	2nd ed.
Series:	Frontiers in electronic testing 34
Subjects:	Metal oxide semiconductors, Complementary > Testing Metal oxide semiconductors, Complementary > Defects > Defects Integrated circuits > Very large scale integration > Testing Integrated circuits > Very large scale integration > Defects
Online Access:	Click Here to View Status and Holdings.
Tags:	Add Tag No Tags, Be the first to tag this record!

Internet