Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching application to rough and natural surfaces

Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching application to rough and natural surfaces

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Bibliographic Details
Main Author: Kaupp, G. Gerd
Format: Book
Published: Berlin Springer-Verlag 2006
Series:Nanoscience and technology
Subjects:
Near-field microscopy
Atomic force microscopy
Online Access:Click Here to View Status and Holdings.
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Description
Physical Description:xii, 292 p. ill. 24 cm
Bibliography:Includes bibliographical references and index
ISBN:3540284052 (hd.bd.)
9783540284055 (hd.bd.)
ISSN:1434-4904

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