Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching application to rough and natural surfaces

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Bibliographic Details
Main Author:	Kaupp, G. Gerd
Format:	Book
Published:	Berlin Springer-Verlag 2006
Series:	Nanoscience and technology
Subjects:	Near-field microscopy Atomic force microscopy
Online Access:	Click Here to View Status and Holdings.
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