Oxide reliability a summary of silicon oxide wearout, breakdown, and reliability
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| Other Authors: | |
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| Format: | Book |
| Published: |
[River Edge, NJ]
World Scientific
2002
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| Series: | Selected topics in electronics and systems ;
v. 23 |
| Subjects: | |
| Online Access: | Click Here to View Status and Holdings. |
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Add Tag | Physical Description: | ix, 270 p. ill. 26 cm |
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| Bibliography: | Includes bibliographical references |
| ISBN: | 9810248423 |
MOS (metal oxide semiconductor) physics and technology