Oxide reliability a summary of silicon oxide wearout, breakdown, and reliability

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Bibliographic Details
Other Authors:	Dumin, D. J
Format:	Book
Published:	[River Edge, NJ] World Scientific 2002
Series:	Selected topics in electronics and systems ; v. 23
Subjects:	Metal oxide semiconductors > Reliability Silicon oxide > Deterioration
Online Access:	Click Here to View Status and Holdings.
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