Digital systems testing and testable design
Saved in:
| Main Author: | |
|---|---|
| Other Authors: | , |
| Format: | Unknown |
| Published: |
New York, NY
IEEE Press
l990
|
| Series: | Electrical engineering, communications, and signal processing
|
| Subjects: | |
| Online Access: | Click Here to View Status and Holdings. |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Add Tag Be the first to leave a comment!
Digital circuit testing and testability