Digital systems testing and testable design

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Bibliographic Details
Main Author:	Abramovici, Miron
Other Authors:	Breuer, Melvin A, Friedman, Arthur D
Format:	Unknown
Published:	New York, NY IEEE Press l990
Series:	Electrical engineering, communications, and signal processing
Subjects:	Digital integrated circuits > Design and construction > Data processing Digital integrated circuits > Testing
Online Access:	Click Here to View Status and Holdings.
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