Digital systems testing and testable design
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Main Author: | Abramovici, Miron |
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Other Authors: | Breuer, Melvin A, Friedman, Arthur D |
Format: | Unknown |
Published: |
New York, NY
IEEE Press
l990
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Series: | Electrical engineering, communications, and signal processing
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Subjects: | |
Online Access: | Click Here to View Status and Holdings. |
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