Digital systems testing and testable design

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Bibliographic Details
Main Author:	Abramovici, Miron
Other Authors:	Breuer, Melvin A, Friedman, Arthur D
Format:	Unknown
Published:	New York, NY IEEE Press l990
Series:	Electrical engineering, communications, and signal processing
Subjects:	Digital integrated circuits > Design and construction > Data processing Digital integrated circuits > Testing
Online Access:	Click Here to View Status and Holdings.
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MARC


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001	wils-183694
020	#	#	\|a 0780310624
090	0	0	\|a TK7874 \|b .A23 1990
100	1	#	\|a Abramovici, Miron
245	1	1	\|a Digital systems testing and testable design \|c Miron Abramovici, Melvin A. Breuer Arthur D. Friedman
260	#	#	\|a New York, NY \|b IEEE Press \|c l990
300	#	#	\|a xxi, 653 p. \|b ill. \|c 25 cm
490	1	#	\|a Electrical engineering, communications, and signal processing
504	#	#	\|a Includes bibliographical references and index
650	#	0	\|a Digital integrated circuits \|x Design and construction \|x Data processing
650	#	0	\|a Digital integrated circuits \|x Testing
700	1	#	\|a Breuer, Melvin A
700	#	#	\|a Friedman, Arthur D
840	#	#	\|a Electrical engineering communications and signal processing serries
856	4	0	\|z Click Here to View Status and Holdings. \|u https://opac.uitm.edu.my/opac/detailsPage/detailsHome.jsp?tid=183694
964	#	#	\|c BOK \|d 01
040	#	#	\|a Shah Alam
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