Digital systems testing and testable design

Digital systems testing and testable design

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Bibliographic Details
Main Author: Abramovici, Miron
Other Authors: Breuer, Melvin A, Friedman, Arthur D
Format: Unknown
Published: New York, NY IEEE Press l990
Series:Electrical engineering, communications, and signal processing
Subjects:
Digital integrated circuits > Design and construction > Data processing
Digital integrated circuits > Testing
Online Access:Click Here to View Status and Holdings.
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Description
Physical Description:xxi, 653 p. ill. 25 cm
Bibliography:Includes bibliographical references and index
ISBN:0780310624

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