Hot-carrier effects in MOS devices

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Bibliographic Details
Main Author:	Takeda, Eiji 1944-
Other Authors:	Yang, C. Y.-W. 1948- Cary Y. -W, Miura-Hamada, Akemi
Format:	Book
Published:	San Diego Academic Press 1995
Subjects:	Metal oxide semiconductors Hot carriers
Online Access:	Click Here to View Status and Holdings.
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020	#	#	\|a 0126822409
090	0	0	\|a TK7871.99.M44 \|b T35 1995
100	1	#	\|a Takeda, Eiji \|c 1944-
245	1	1	\|a Hot-carrier effects in MOS devices \|c Eiji Takeda, Cary Y. Yang, Akemi Miura-Hamada
260	#	#	\|a San Diego \|b Academic Press \|c 1995
300	#	#	\|a xii, 312 p. \|b ill. \|c 24 cm
504	#	#	\|a Includes bibliographical references (p. 187-301) and index
650	#	0	\|a Metal oxide semiconductors
650	#	0	\|a Hot carriers
700	1	#	\|a Yang, C. Y.-W. \|c 1948- \|q Cary Y. -W
700	#	#	\|a Miura-Hamada, Akemi
856	4	0	\|z Click Here to View Status and Holdings. \|u https://opac.uitm.edu.my/opac/detailsPage/detailsHome.jsp?tid=151139
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