Hot-carrier effects in MOS devices

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Bibliographic Details
Main Author:	Takeda, Eiji 1944-
Other Authors:	Yang, C. Y.-W. 1948- Cary Y. -W, Miura-Hamada, Akemi
Format:	Book
Published:	San Diego Academic Press 1995
Subjects:	Metal oxide semiconductors Hot carriers
Online Access:	Click Here to View Status and Holdings.
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