Hot-carrier effects in MOS devices

Hot-carrier effects in MOS devices

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Bibliographic Details
Main Author: Takeda, Eiji 1944-
Other Authors: Yang, C. Y.-W. 1948- Cary Y. -W, Miura-Hamada, Akemi
Format: Book
Published: San Diego Academic Press 1995
Subjects:
Metal oxide semiconductors
Hot carriers
Online Access:Click Here to View Status and Holdings.
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Description
Physical Description:xii, 312 p. ill. 24 cm
Bibliography:Includes bibliographical references (p. 187-301) and index
ISBN:0126822409

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