Assessing fault model and test quality
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| Format: | Unknown |
| Published: |
Boston
Kluwer Academic
1992
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| Series: | The Kluwer international series in engineering and computer science VLSI, computer architecture, and digital signal processing
SECS 157. |
| Subjects: | |
| Online Access: | Click Here to View Status and Holdings. |
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Fault diagnosis and fault tolerance a systematic approach to special topics
ESSENTIALS OF ELECTRONIC TESTING FOR DIGITAL, MEMORY AND MIXED-SIGNAL VLSI CIRCUIT
