Assessing fault model and test quality

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Bibliographic Details
Main Author:	Butler, Kenneth M. 1962-
Other Authors:	Mercer, Melvin Ray
Format:	Unknown
Published:	Boston Kluwer Academic 1992
Series:	The Kluwer international series in engineering and computer science VLSI, computer architecture, and digital signal processing SECS 157.
Subjects:	Digital integrated circuits > Testing Fault-tolerant computing
Online Access:	Click Here to View Status and Holdings.
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