Assessing fault model and test quality

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Bibliographic Details
Main Author:	Butler, Kenneth M. 1962-
Other Authors:	Mercer, Melvin Ray
Format:	Unknown
Published:	Boston Kluwer Academic 1992
Series:	The Kluwer international series in engineering and computer science VLSI, computer architecture, and digital signal processing SECS 157.
Subjects:	Digital integrated circuits > Testing Fault-tolerant computing
Online Access:	Click Here to View Status and Holdings.
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LEADER	00000n a2200000 a 4501
001	wils-130031
020	#	#	\|a 0792392221
090	0	0	\|a TK7874 \|b .B85 1992
100	1	#	\|a Butler, Kenneth M. \|d 1962-
245	1	1	\|a Assessing fault model and test quality \|c by Kenneth M. Butler and M. Ray Mercer
260	#	#	\|a Boston \|b Kluwer Academic \|c 1992
300	#	#	\|a xviii, 132 p. \|b ill. \|c 24 cm
490	1	#	\|a The Kluwer international series in engineering and computer science \|a VLSI, computer architecture, and digital signal processing \|v SECS 157.
504	#	#	\|a Includes bibliographical references and index
650	#	0	\|a Digital integrated circuits \|x Testing
650	#	0	\|a Fault-tolerant computing
700	1	#	\|a Mercer, Melvin Ray
856	4	0	\|z Click Here to View Status and Holdings. \|u https://opac.uitm.edu.my/opac/detailsPage/detailsHome.jsp?tid=130031
964	#	#	\|c BOK \|d 01
040	#	#	\|a Shah Alam
998	#	#	\|a 00260##a002.8.2\|\|00260##b002.8.4\|\|00260##c002.7.6\|\|00300##a003.4.1\|\|00300##b003.6.1\|\|00300##c003.5.1\|\|