Assessing fault model and test quality

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Bibliographic Details
Main Author: Butler, Kenneth M. 1962-
Other Authors: Mercer, Melvin Ray
Format: Unknown
Published: Boston Kluwer Academic 1992
Series:The Kluwer international series in engineering and computer science VLSI, computer architecture, and digital signal processing SECS 157.
Subjects:
Online Access:Click Here to View Status and Holdings.
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Description
Physical Description:xviii, 132 p. ill. 24 cm
Bibliography:Includes bibliographical references and index
ISBN:0792392221