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    Adaptive signal processing next generation solutions

    Adaptive signal processing next generation solutions

    Published 2010
    “…IEEE, Institute of Electrical and Electronics Engineers/Wiley…”
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    Semiconductor memories technology, testing, and reliability

    Semiconductor memories technology, testing, and reliability by Sharma, Ashok K

    Published 1997
    “…IEEE, the Institute of Electrical and Electronics Engineers Wiley-Interscience…”
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