Search Results - "X-ray diffraction"
Suggested Topics within your search.
Suggested Topics within your search.
- Diffraction 12
- X-rays 12
- X-ray diffraction imaging 3
- Measurement 2
- Radiography, Industrial 2
- X-ray crystallography 2
- Biochemistry 1
- Carbon nanotubes 1
- Chemistry, Analytic 1
- Chemistry, Physical and theoretical 1
- Crystallography 1
- Design and construction 1
- Detectors 1
- Dielectrics 1
- Equipment and supplies 1
- Fluroscopy 1
- Industrial applications 1
- Inspection 1
- Integrated circuits 1
- Methods 1
- Mineralogy 1
- Optical properties 1
- Physical biochemistry 1
- Polycrystalline semiconductors 1
- Powders 1
- Programmed instruction 1
- Quality control 1
- Radiation 1
- Refractometers 1
- Residual stresses 1
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X-ray diffraction a practical approch
Published 1998Click Here to View Status and Holdings.
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Elements of x-ray diffraction
Published 1978Subjects: “…X-rays Diffraction…”
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Elements of X-ray diffraction
Published 1967Subjects: “…X-rays Diffraction…”
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Elements of X-Ray Diffraction
Published 2001Subjects: “…X-rays Diffraction…”
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X-Ray Diffraction Imaging Technology and Applications
Published 2019Subjects: Click Here to View Status and Holdings.
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X-RAY DIFFRACTION STUDIES OF TITANIUM DIOXIDE POEDERS BY A SOL-GEL METHOD
Click Here to View Status and Holdings.
Thesis Book -
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Industrial applications of X-ray diffraction
Published 2000Subjects: “…X-rays Diffraction…”
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X-ray diffraction by polycrystalline materials
Published 2007Subjects: Click Here to View Status and Holdings.
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PHASE AND MORPHOLOGY STUDIES OF LITHIUM NICKELATES, LiNiO2 AND LITHIUM COBALTATES, LiCoO2
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Thesis Book -
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Quantitative X-ray diffractometry
Published 1995Subjects: Click Here to View Status and Holdings.
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Outline of crystallography for biologists
Published 2002Subjects: Click Here to View Status and Holdings.
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Analysis of residual stress by diffraction using neutron and synchrotron radiation
Published 2003Subjects: “…X-rays Diffraction…”
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Fundamentals of powder diffraction and structural characterization of materials
Published 2009Subjects: Click Here to View Status and Holdings.
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X-ray metrology in semiconductor manufacturing
Published 2006Subjects: Click Here to View Status and Holdings.
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