Search Results - "FRONTIERS IN ELECTRONIC TESTING"
Suggested Topics within your search.
Suggested Topics within your search.
- Testing 6
- Integrated circuits 4
- Very large scale integration 3
- Metal oxide semiconductors, Complementary 2
- Data mining 1
- Defects 1
- Digital electronics 1
- Digital integrated circuits 1
- Electronic circuits 1
- Failures 1
- Microtechnology 1
- Nanotechnology 1
- Plug and play (Computer architecture) 1
- Semiconductors 1
- Statistical methods 1
- Systems on a chip 1
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ESSENTIALS OF ELECTRONIC TESTING FOR DIGITAL, MEMORY AND MIXED-SIGNAL VLSI CIRCUITS
Published 2002“…FRONTIERS IN ELECTRONIC TESTING…”
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Book
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2
SOC (system-on-a-chip) testing for plug and play test automation
Published 2002“…Frontiers in electronic testing…”
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3
Advances in electronic testing challenges and methodologies
Published 2006“…Frontiers in electronic testing…”
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4
Data mining and diagnosing IC fails
Published 2005“…Frontiers in electronic testing…”
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5
Defect-oriented testing for nano-metric CMOS VLSI circuit
Published 2007“…Frontiers in electronic testing…”
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6
Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
Published 2008“…Frontiers in electronic testing…”
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Book -
7
IDDQ testing of VLSI circuits
Published 1993“…Frontiers in electronic testing…”
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