Principles of semiconductor network testing

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Bibliographic Details
Main Author:	Afshar, Amir
Format:	Book
Published:	Boston Butterworth-Heinemann 1995
Subjects:	Integrated circuits > Testing Semiconductors > Testing
Online Access:	Click Here to View Status and Holdings.
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090	0	0	\|a TK7874 \|b .A339 1995
100	1	#	\|a Afshar, Amir
245	1	1	\|a Principles of semiconductor network testing \|c Amir Afshar
260	#	#	\|a Boston \|b Butterworth-Heinemann \|c 1995
300	#	#	\|a xiv, 213 p. \|b ill. \|c 25 cm
504	#	#	\|a Includes bibliographical references and index
650	#	0	\|a Integrated circuits \|x Testing
650	#	0	\|a Semiconductors \|x Testing
856	4	0	\|z Click Here to View Status and Holdings. \|u https://opac.uitm.edu.my/opac/detailsPage/detailsHome.jsp?tid=99950
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