Statistical approach to VLSI

Statistical approach to VLSI

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Bibliographic Details
Other Authors:	Maly, W, Director, Stephen W
Format:	Book
Published:	Amsterdam North-Holland 1994
Series:	Advances in CAD for VLSI v. 8
Subjects:	Mathematical optimization Integrated circuits > Very large scale integration > Defects Integrated circuits > Very large scale integration > Design and construction > Statistical methods
Online Access:	Click Here to View Status and Holdings.
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