Statistical approach to VLSI

Statistical approach to VLSI

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Bibliographic Details
Other Authors: Maly, W, Director, Stephen W
Format: Book
Published: Amsterdam North-Holland 1994
Series:Advances in CAD for VLSI v. 8
Subjects:
Mathematical optimization
Integrated circuits > Very large scale integration > Defects
Integrated circuits > Very large scale integration > Design and construction > Statistical methods
Online Access:Click Here to View Status and Holdings.
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Description
Physical Description:x, 391 p. ill. 25 cm
Bibliography:Includes bibliographical references and index
ISBN:0444883711

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