EFFECTS OF ANNEALING TEMPERATURE AND TIME ON THE SILICON WAFER WITH LIQUID & SOLID DOPANTS
The project is a study the behaviour of N and P-type dopant on silicon wafer by using both liquid and solid dopant sources. For P-type silicon wafer, we doped with Phosphorous while for N-type silicon wafer, we doped with Boron.
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001 | wils-940472 | ||
005 | 2019319153048 | ||
008 | 191018s2011 MY ag# ta000 ##ENG#D | ||
040 | # | # | |a UiTM |b eng |c UiTM |e rda |
090 | 0 | 0 | |a TN690 |b .R59 2011 |
100 | 0 | # | |a Riziana Saari |e author |
245 | 1 | 0 | |a EFFECTS OF ANNEALING TEMPERATURE AND TIME ON THE SILICON WAFER WITH LIQUID & SOLID DOPANTS |c RIZIANA BINTI SAARI |
264 | # | 0 | |a Shah Alam, Selangor |b Universiti teknologi MARA, Faculty of Applied Sciences |c 2011 |
300 | # | # | |a xvi, 100 pages: |b illustrations (some color); |c 30 cm |
336 | # | # | |a text |2 rdacontent |
337 | # | # | |a unmediated |2 rdamedia |
338 | # | # | |a volume |2 rdacarrier |
500 | # | # | |a UiTM X Digitization |
502 | # | # | |a Student report(BSc.)-Universiti Teknologi MARA, Faculty of Applied Sciences, 2011 |
504 | # | # | |a Includes bibliographical references (page 97-98) |
520 | # | # | |a The project is a study the behaviour of N and P-type dopant on silicon wafer by using both liquid and solid dopant sources. For P-type silicon wafer, we doped with Phosphorous while for N-type silicon wafer, we doped with Boron. |
650 | # | 0 | |a Annealing of metals |
650 | # | 0 | |a Deformations (Mechanics) |
650 | # | 0 | |a Strength of materials |
710 | 2 | # | |a Faculty Of Applied Sciences |e issuing body |
710 | 2 | # | |a Fakulti Sains Gunaan |e issuing body |
856 | 4 | 0 | |z Click Here to View Status and Holdings. |u https://opac.uitm.edu.my/opac/detailsPage/detailsHome.jsp?tid=940472 |
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