CHARACTERIZATION ON A-SIC THIN FILM BY XRAY DIFFRACTION,RAMAN SPECTROSCOPY AND INFRARED RADIATION SPECTROSCOPY
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Format: | Thesis |
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SHAH ALAM, SELANGOR
UNIVERSITI TEKNOLOGI MARA, FACULTY OF APPLIED SCIENCES
2010
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Online Access: | Click Here to View Status and Holdings. |
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001 | wils-939140 | ||
005 | 2019228151827 | ||
100 | 0 | # | |a NUR SYUHADA MOHD SHAHRIL |e author |
245 | 1 | 0 | |a CHARACTERIZATION ON A-SIC THIN FILM BY XRAY DIFFRACTION,RAMAN SPECTROSCOPY AND INFRARED RADIATION SPECTROSCOPY |c NUR SYUHADA MOHD SHAHRIL |
264 | # | 1 | |a SHAH ALAM, SELANGOR |b UNIVERSITI TEKNOLOGI MARA, FACULTY OF APPLIED SCIENCES |c 2010 |
500 | # | # | |a UiTM X Digitization |
502 | # | # | |a Student report(BSc.)-UNIVERSITI TEKNOLOGI MARA, FACULTY OF APPLIED SCIENCES 2011 |
040 | # | # | |a Shah Alam |
856 | 4 | 0 | |z Click Here to View Status and Holdings. |u https://opac.uitm.edu.my/opac/detailsPage/detailsHome.jsp?tid=939140 |
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