INVESTIGATION OF EFFECT GATE SIZE'S SCALING IN NMOSFET ON CURRENT-VOLTAGE (I-V) CHARACTERISTIC

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Bibliographic Details
Main Author:	MAZUIN AB RAHMAN (Author)
Format:	Thesis
Published:	Shah Alam, Selangor Universiti Teknologi MARA. Faculty of Applied Sciences 2010
Online Access:	Click Here to View Status and Holdings.
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