Unified methods for VLSI simulation and test generation

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Bibliographic Details
Main Author:	Cheng, Kwang-Ting 1961-
Other Authors:	Agrawal, Vishwani D. 1943-
Format:	Book
Language:	English
Published:	Boston Kluwer Academic Publishers 1989
Series:	The Kluwer international series in engineering and computer science #SECS 73
Subjects:	Computer-aided design Integrated circuits > Very large scale integration > Testing Integrated circuits > Very large scale integration > Design and construction > Data processing Integrated circuits > Very large scale integration > Computer simulation
Online Access:	Click Here to View Status and Holdings.
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008	940618s1989 maua b 00110 eng
020	#	#	\|a 0792390253
090	0	0	\|a TK7874 \|b .C525 1989
100	1	#	\|a Cheng, Kwang-Ting \|d 1961-
245	1	1	\|a Unified methods for VLSI simulation and test generation \|c by Kwang-Ting Cheng and Vishwani D. Agrawal
260	#	#	\|a Boston \|b Kluwer Academic Publishers \|c 1989
300	#	#	\|a xii, 148 p. \|b ill. \|c 24 cm
490	1	#	\|a The Kluwer international series in engineering and computer science \|v #SECS 73
500	#	#	\|a At head of title: AT&T.
504	#	#	\|a Bibliography: p. [113]-143.
650	#	1	\|a Computer-aided design
650	#	#	\|a Integrated circuits \|x Very large scale integration \|x Testing
650	#	#	\|a Integrated circuits \|x Very large scale integration \|x Design and construction \|x Data processing
650	#	#	\|a Integrated circuits \|x Very large scale integration \|x Computer simulation
700	1	#	\|a Agrawal, Vishwani D. \|d 1943-
856	4	0	\|z Click Here to View Status and Holdings. \|u https://opac.uitm.edu.my/opac/detailsPage/detailsHome.jsp?tid=89034073
964	#	#	\|c BOK \|d 01
040	#	#	\|a Shah Alam