Unified methods for VLSI simulation and test generation

Unified methods for VLSI simulation and test generation

Saved in:
Bibliographic Details
Main Author: Cheng, Kwang-Ting 1961-
Other Authors: Agrawal, Vishwani D. 1943-
Format: Book
Language:English
Published: Boston Kluwer Academic Publishers 1989
Series:The Kluwer international series in engineering and computer science #SECS 73
Subjects:
Computer-aided design
Integrated circuits > Very large scale integration > Testing
Integrated circuits > Very large scale integration > Design and construction > Data processing
Integrated circuits > Very large scale integration > Computer simulation
Online Access:Click Here to View Status and Holdings.
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Item Description:At head of title: AT&T.
Physical Description:xii, 148 p. ill. 24 cm
Bibliography:Bibliography: p. [113]-143.
ISBN:0792390253

Similar Items