IEEE standard test access port and boundary-scan architecture
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| Corporate Authors: | , , |
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| Format: | Unknown |
| Published: |
New York, N.Y.
Institute of Electrical and Electronics Engineers
1993
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| Subjects: | |
| Online Access: | Click Here to View Status and Holdings. |
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Add Tag | Item Description: | SH16626--On cover |
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| Physical Description: | 1 v. (various paging) ill. 28 cm |
| ISBN: | 1559373504 |
The test access port and boundary-scan architecture