Characterization in compound semiconductor processing

Saved in:
Bibliographic Details
Other Authors: Strausser, Yale, McGuire, G. E
Format: Book
Published: Boston Butterworth-Heinemann 1995
Series:Materials characterization series
Subjects:
Online Access:Click Here to View Status and Holdings.
Tags: Add Tag
No Tags, Be the first to tag this record!

MARC

LEADER 00000n a2200000 a 4501
001 wils-88150
020 # # |a 0750692669 
090 0 0 |a QC611.8.C64  |b C48 1995 
245 1 1 |a Characterization in compound semiconductor processing  |c editors, Yale Strausser and Gary E. McGuire ; consulting editor, C. R. Brundle ; managing editor, Lee E. Fitzpatrick 
260 # # |a Boston  |b Butterworth-Heinemann  |c 1995 
300 # # |a xiv, 199 p.  |b ill.  |c 25 cm 
490 1 # |a Materials characterization series 
504 # # |a Includes bibliographical references and index 
650 # 0 |a Compound semiconductors 
650 # 0 |a Compound semiconductors  |x Surfaces 
700 1 # |a Strausser, Yale 
700 # # |a McGuire, G. E 
856 4 0 |z Click Here to View Status and Holdings.  |u https://opac.uitm.edu.my/opac/detailsPage/detailsHome.jsp?tid=88150 
964 # # |c BOK  |d 01 
040 # # |a Shah Alam 
998 # # |a 00260##a002.8.2||00260##b002.8.4||00260##c002.7.6||00300##a003.4.1||00300##b003.6.1||00300##c003.5.1||01700##a0011.2.2||